SlurryScope can be used for multiple applications


Slurry blend preparation, including raw materials: 

Raw Slurry – Identify suspension issues (inhomogeneous mixing,solids distribution, settling in tote/drum)
Batch Blending – Batch to batch LPC performance
Local Circulation Loop – Verify LPC count during batch qualification
Side Switching - Batch to batch LPC verification and trending
Global Loop Supply – Verify LPC prior to VMB
Configuration for slurry blend analysis...
Graph of Ceria delivery over time...

Filtration LPC issues, operation and maintenance

Filter – Detect element end of life and/or breakthrough

CMP POU slurry LPC to wafer CMP performance correlation

Global Loop Return – Detect loop-generated LPC
Point of Use – Correlate wafer-to-wafer CMP results with slurry LPC
Configuration to correlate LPC to wafer CMP results...